An independent Z piezoelectric ceramic/probe holder module for the SA AFM and NP AFM. Designed for making low noise
measurements.With a Z range of 7 μm and specified noise floor of 0.12 nm, it is ideal for nano-roughness measurements.
AFMWorkshop’s tip scanning atomic force microscopes include the SA AFM, the NP AFM, and the LS AFM. These systems all use an independent Z piezoelectric ceramic/ probe holder module. AFMWorkshop offers two probe holders for tip- scanning atomic force microscopes that are interchangeable and designed for different applications.
Both Z probe holders include a probe exchange guide which facilitates probe exchanges. To exchange probes, the probe module is simply placed on top of the exchange guide, light pressure is applied, the guide then releases the probe clamping spring, and the probe is then easily exchanged.
The TS-Z6 module is designed for making low noise measurements with the SA and NP units. With a Z range of 7 μm and specified noise floor of 0.12 nm, it is ideal for nano-roughness measurements.
