TT-2 Atomic Force Microscope Stage
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Model: MS-3230
The TT-2 AFM stage has the excellent thermal and mechanical stability required for high-resolution AFM scanning. Additionally, its open design facilitates user modification. This stage is designed to work with the AFMWorkshop Control Station including an Ebox and AFMControl software.
Download TT-2 AFM Stage Datasheet
Features and Benefits of the TT-2 AFM Stage include
Rigid Frame Design
The crossed beam design for the stage support is extremely rigid so the AFM is less susceptible to external vibrations.
Light Lever AFM Force Sensor
Light lever force sensors are used in almost all atomic force microscopes and permit many types of experiments.
Integrated Probe Holder/Probe Exchanger
Probe Exchange is made quick and easy with AFMWorkshop's unique probe holder and clipping mechanism.
Direct Drive Z stage
A fast probe approach is possible because probe/sample angle alignment is not required. A linear motion stage is used to move the probe in a perpendicular motion to the sample.
Small Footprint
Requires little space and fit easily on a tabletop with stage dimensions of 7.5 x 12".
Precision XY Stage with Micrometer
The sample can be moved without touch. The sample is moved relative to the probe with a precision XY micrometer stage.
Modes Electric Plug
Capabilities of the TT-2 AFM are dramatically expanded via a six pole electrical plug at the back of the stage
Laser/Detector Alignment
Laser/detector alignment is simplified via a direct view to both the light lever laser and the photo detector adjustment mechanism.
Video Optical Microscope
A high resolution video optical microscope is used for locating features on a surface, aligning the light lever force sensor, and facilitating probe approach. The video optical microscope includes an XY micrometer stage for moving the video microscope relative to the AFM probe.
Included with the Product
- TT-AFM Stage
- Video Optical Microscope
- 60 pin ribbon cable
- USB cable
- TT-2 AFM Manual
Note: This product does not include an XYZ piezoelectric scanner
Specifications
Light Lever AFM Force Sensor
| Type | Magnet |
| Probe Types | Industry standard |
| Probe Insertion | Manual – probe exchange tool |
| Probe Holding Mechanism | Clip Vibrating mode piezo Electrical connector to probe |
| Laser/Detector Adjustment Range | +/- 1.5 mm |
| Adjustment resolution | 1 µm |
| Minimum Probe to Objective | 25 mm |
| Laser Type | 670 nm diode, < 5 mw |
Video Microscope
|
Minimum Zoom
Maximum Zoom
Field of view
2 x 2 mm
300 x 300 µm
Resolution
20 µm
2 µm
Working Distance
114 mm
114 mm
Magnification
45X
400X
|
Detector
| Type | 4 quadrant |
| Band Width | > 500 kHz |
| Signals Transmitted | TL, BL, TR, BR |
| Gain | Lo, High Settings |
| Probe sample angle | 10° |
XY Translator
| Range | 25.4 mm |
| Resolution | 2 µm |
| Type | Bearing - spring loaded |
| Lock Down | Yes |
Z Motion
| Type | Direct Drive |
| Range | 25 mm |
| Drive Type | Stepper Motor |
| Min. Step Size | 330 nm |
| Slew Rate | 8 mm/minute |
| Limit Switch | Top, Bottom |
| Control | Software – rate, step size |
