High Resolution Video Microscope | Readily locate Features for Scanning |
Multiple Sample Stage or Vacuum Chuck | Optimized for specific technical samples |
Closed Loop XY scanner | Great accuracy with rapid zoom to feature |
Probe Exchange Tool | Reduce time for probe exchange |
In plane flexure XY scanner | Minimal out of plane motion in images |
Labview software with USB communication | Readily adaptable to new operating systems |
Uses Industry standard probes | Probes for specific measurements are readily available. |
Includes Vibrating, Non-Vibrating modes | Turnkey system |
Pricing |
From $41,775.00* |
Download: |
NP AFM Product Datasheet PDF![]() NP AFM-4022 3D ![]() NP AFM-4012 3D ![]() |
Nano-Profiler AFM Overview
The NP AFM is a complete nanoprofiler tool including everything required for scanning samples: microscope stage, electronic box, control computer, probes, manuals, and a video microscope. Samples as large as 200 mm X 200 mm X 20 mm are profiled by the NP AFM system, and several stage options are available for many types of samples. The Nano-Profiler AFM is primarily used for routine scanning of technical samples such as wafers and disks or for nanotechnology research.
Key Features of the NP AFM
Nano-Profiling AFM | The NP AFM accommodates industry-standard sized probes and is used for profiling technical samples including wafers and disks in industry applications. |
Standard Operating Modes | Vibrating mode is used for high resolution and soft samples, while non-vibrating mode can be used for routine scanning. Also included with the system are phase and lateral force modes. |
Three Sample Stage Options | Three sample stage options can accommodate different samples with sizes as large as 200mm X 200mm X 20mm. |
Linearized X, Y Piezoelectric Scanner | Piezoelectric X and Y scanners incorporate strain gauges that provide linear scans and rapid zoom-to-feature capabilities. |
Direct-Drive Tip Approach | A linear motion stage is used to move the probe perpendicular to the sample. Probe angle alignment is not required, facilitating a much faster probe approach. |
LabVIEW Operation | Industry standard programming environment, functions include setting scanning parameters, probe approach, frequency tuning, and displaying images in real time. Compatible with older operating systems as well. |
Video Microscope | The video optical microscope in a NP-2 AFM serves three functions: aligning the laser onto the cantilever in the light lever AFM, locating surface features for scanning, and facilitating probe approach. |
NP AFM Capabilities
Visualization of Surface Features | Visualization of surface features can help understand why a process is working or not working. AFM offers extreme contrast on flat samples often encountered in industry wafers and disks for quality control and assurance. |
Surface Roughness/Texture | Surface roughness measurements at the nanoscale are only possible with an atomic force microscope. With the appropriate vibration isolation enclosure, it is possible to measure surface textures under 0.1 nm. |
Step-Height Measurements | The NP AFM is a stylus profiler capable of making step height measurements from 0.3 to 500 nanometers. An included video microscope is essential for locating regions of interest for scanning. |