This website is using cookies
We use cookies and other tracking technologies to improve your browsing experience on our website, to show you personalized content and targeted ads, to analyze our website traffic, and to understand where our visitors are coming from. By browsing our website, you consent to our use of cookies and other tracking technologies.
AFM Workshop

AFM Probes

Atomic Force Microscope Probes

Atomic Force Microscopy Probes are used for all atomic force microscope applications, and are operated in vibrating (tapping), non-vibrating (contact), lithography, conductive and magnetic AFM, as well as force distance scanning. AFM Probes are nanofabricated using highly-doped single crystal silicon with unparalleled reproducibility, robustness, and sharpness, giving consistent high-quality AFM images.

AFMWorkshop offersAFM probes from the largest international probe manufacturers at discounted prices. These probes are available to US customers that own AFMWorkshop products only.


ACLA AFM Probes are designed for vibrating mode (non-contact, tapping mode, intermittent contact, and/or close contact)...

Learn More...


SHOCONA Probes are designed for non-vibrating, contact mode applications and are compatible with most commercially...

Learn More...

Search for mobile