SHOCONA AFM/SPM Probe

Name: Atomic Force Microscopes for High-Resolution Scanning - AFMWorkshop
Address: 1434 E 33rd St., Signall Hill, CA, US
Telephone: 1 (888) 671-5539
Price range: $19495 - $68,887

SHOCONA Probes are designed for non-vibrating, contact mode applications and are compatible with most commercially available SPMs/AFMs. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging capabilities. This is a box of 10 probes.

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Description

Model ID: SHOCONA-10

SHOCONA AFM Probes are designed for contact mode applications with a shorter length, providing better sensitivity without compromising on spring constant requirements. The reflex side is coated with aluminum for increased laser signal quality.

Tip Specifications

Material: Silicon
Shape: Pyramidal
Height (µm): 14-16
Aspect Ratio: 1.5-3.0
ROC* (nm): 6
Coating: None

Cantilever Specifications

Material: Silicon
Shape: Rectangular
Reflex Coating: Al, 50 nm ± 5 nm

Parameter	Nominal Value	Minimum Value	Maximum Value
Spring Constant (N/m)	0.14	0.01	0.60
Frequency (kHz)	21	8	37
Length (µm)	225	215	235
Width (µm)	46	41	51
Thickness (µm)	1.0	0.5	1.5