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Introduction to AFM
AFM Tutorials
1.1 Introduction to AFM
1.2. Force Sensor
1.3. Position Sensing Device
1.4. AFM Stage
1.5. Probe-Sample
1.6. Non-Vibrating Mode
1.7 Vibrating Mode
2. Vibrating Mode
2.2. Vibrating Instrument
2.3. Controlled Parameters
2.4. Vibrating Modes
2.5. Vibrating Mode Summary
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TT-2 AFM Assembly Workshop
$1,695.00
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Nanoparticle Characterization with Atomic Force Microscopy
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AFM Bioapplications
$1,495.00
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Advanced AFM Operation Techniques
$1,495.00
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2019 Porto AFM Training Workshop
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Characterization of Polymer Materials - AFM Training
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On-SiteTraining
International On-Site AFM Installation and Training IT-2213
$9,995.00
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On-Site AFM Installation and Training - IT-2011
$5,995.00
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EducationalMaterials
AFM Curriculum
$995.00
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Atomic Force Microscope Book
$100.00
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Home
Products
Atomic Force Microscopes
B AFM
TT-2 AFM
HR AFM
LS AFM
NP AFM
SA AFM
Custom Microscopes
Modes
Vibration Solutions
Passive Vibration Table
Active Vibration Table
Q-Box
AFM Glove Box
LS Enclosure
Accessories
50 Micron AFM Scanner
15 Micron AFM Scanner
7 Micron Z Piezoelectric Ceramic/Probe Holder
16 Micron Z Piezoelectric Ceramic/Probe Holder with Strain Gauge
Environmental Cell
Dunk and Scan Liquid Cell and Probe Holder for TT-2 AFM
Focus Assist for TT-2 AFM
Image Logger for TT-2 AFM
Documentation Package for TT-2 AFM
Documentation Package for NP/SA/LS AFM
Atomic Force Microscope Ebox
TT-2 Atomic Force Microscope Stage
Dunk and Scan Liquid Cell and Probe Holder for NP/SA/LS AFM
Probes
ACLA AFM/SPM Probe
SHOCONA AFM/SPM Probe
Training
AFM Workshops
On-Site Training
Educational Materials
Price List
Applications
Research
Nanotechnology
Life Sciences
Instrument Innovation
Nanoparticles
Polymers
Customer Publications
2D Materials
Industry
Automotive Industry
Process Control
Photonics
Pharmaceutical
Education
High School
College/University
Image Gallery
Learning Center
Introduction to AFM
AFM Tutorials
1.1 Introduction to AFM
1.1.1 Generating an Image
1.1.2 Key Topics
1.2. Force Sensor
1.2.1. Photo Detector
1.2.2. Position Sensing Device
1.2.3. Light Lever
1.3. Position Sensing Device
1.3.1. Motion
1.3.2. Proportional
1.3.3. Y Scanner
1.3.4. Z Scanner
1.4. AFM Stage
1.4.1. Z Motion
1.4.2. Cantilever Flexing
1.4.3. Sensor Output
1.4.4. Feedback
1.4.5. Scanning
1.5. Probe-Sample
1.5.1. Contamination
1.5.2. Probe Shape-hole
1.5.3. Probe Shape-bump
1.6. Non-Vibrating Mode
1.6.1. Tip Sample
1.6.2. Scanning
1.7 Vibrating Mode
1.7.1. Vibrating probe
1.7.2. Tip Sample
1.7.3. Scanning
2. Vibrating Mode
2.1. Introduction
2.1.1. Vibrating Cantilever
2.1.2. Vib Tip Samp
2.1.3. Vibrate Scan
2.1.4. Capillary
2.2. Vibrating Instrument
2.2.1. Vibrating Instrument - Tickler
2.2.2. Amplitude Detector
2.2.3. Feedback
2.3. Controlled Parameters
2.3.1. Amplitude Control
2.3.2. Frequency Control
2.3.3. Average Distance Cont
2.3.4. Resonant Freq. Cont
2.4. Vibrating Modes
2.4.1. High Amp - In and Out
2.4.2. On Contamination - Small Vibration
2.4.3. In Contamination - Small Vibration
2.5. Vibrating Mode Summary
AFM Technology
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Client area
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