AFM Workshop

Atomic Force Microscopy Applications

AFM Applications

Atomic Force Microscopes have a range of applications from nanotechnology and biology to engineering and semiconductors. AFMs are an essential technology applied by scientists and researchers for visualizing nanostructures and making measurements at the nanoscale including surface roughness and step-height measurements.

Atomic force microscopes are essential tools for nanotechnology research, providing the necessary resolution for the visualization and measurement of nanostructures including nanoparticles, DNA, thin films, polymers, and much more. With noise floors as low as 0.08 nm, AFM Workshop microscopes are fully capable of handling your nanotechnology research needs.
AFMs are capable of scanning biological samples that would be difficult or impossible to scan with any other type of microscope. Biomaterials, cells, and other soft samples are able to be scanned in ambient air as well as liquids to measure parameters including stiffness and adhesion.
Atomic Force Microscopes are key measurement instruments for nanotechnology developments in all disciplines of science and engineering. There is a growing demand by students as well as professionals for AFM education and training. AFMWorkshop has considerable advantages for both groups of learners.
Atomic force microscopy is cost effective technique for evaluating samples for process development, and to control a process. AFM measurements used in process control are typically routine and made repetitively. Accuracy and precision can be assured by using standard measurement protocols and qualified probe tips.
AFMWorkshop atomic force microscopes are ideal for instrument builders and engineers who want to use AFM as a platform for creating new instrumentation, such as new imaging modes. AFM can also be used in combination with another analytical instrument.
AFM allows for 3D characterization of nanoparticles with sub-nanometer resolution. Nanoparticle characterization using atomic force microscopy has a number of advantages over dynamic light scattering, electron microscopy and optical characterization methods.
Atomic Force Microscopes (AFMs) offer substantially better horizontal and vertical resolution than optical and stylus profilers. For this reason, AFMs are ideal for the analysis of materials used in the photonics industry.
Atomic force microscopy is a powerful method for imaging polymers, polymer blends, and polymer composites with nanometer lateral resolution. For polymer applications, the AFM now resides alongside optical microscopy and electron microscopy as essential tools for characterization.
AFMWorkshop customers use their atomic force microscopes for a variety of research, often which is published in academic journals worldwide.
AFMWorkshop atomic force microscopes offer high-resolution imaging capabilities, allowing researchers to measure and visualize nanotechnology samples under the size of a nanometer.
Polymer nanoparticles (PNP) are popular candidates for drug delivery due to their small, well-controlled size and ability to tailor their structure both physically and chemically.

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