All atomic force microscopes manufactured by AFMWorkshop include standard scanning AFM modes: vibrating (tapping), non-vibrating (contact), phase scanning, lateral force mode (LFM), and measurement of force-distance curves. Optional modes expand the capability of your atomic force microscope. These include: Conductive AFM, Magnetic Force Microscopy (MFM), Lithography, and Advanced Force-Distance modes. Measuring the conductivity, surface magnetic field, force curves, and manipulation of surfaces are possible with these modes.
Standard Modes
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Vibrating mode imaging is the most common mode for measuring topography images with an AFM. In vibrating mode the vibration amplitude of the probe is held constant during a scan. Adjustable parameters include the vibrating frequency, amplitude of vibration, and the amount of dampening of the vibrating probe.
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In non-vibrating mode, commonly called contact mode, the deflection of a cantilever is held constant during scanning. This mode is often used for scanning in liquids and is also used for measuring force-distance curves.
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Lateral force mode measures the local friction a probe senses as it is scanned across a surface. The friction can be caused by surface texture or by differing chemical composition.
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Phase mode images are measured in vibrating mode and are useful for identifying different areas of hardness on a surface. The technique operates by measuring the phase change caused by differing materials on a surface while scanning.
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Force-Distance curves measure the deflection of a cantilever as it interacts with a surface. Force-Distance measurements monitor such surface parameters as: Adhesion, Stiffness, Compliance, Hardness, and Contaminate Thickness. This simple AFM module allows measurements of force-distance curves. It can be upgraded to the Advanced Force-Distance module (see below).
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Optional Modes
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The C-AFM measures topography and conductivity images simultaneously. This option allows measuring current-voltage (I/V) curves at specific locations on a surface. Learn More... |
.jpg "Conductive AFM (C-AFM)") |
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Measures surface magnetic field by incorporating a magnetic probe into the AFM. MFM is used to generate images of magnetic fields on a surface, and is particularly useful in the development of magnetic recording technology. Magnetic fields associated with individual magnetic nanoparticles are also revealed through MFM.
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.jpg "Magnetic Force Microscopy (MFM)") |
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This NanoLithography software option enables the AFM probe to alter the physical or chemical properties of the surface. Created in LabVIEW and integrated with the AFMControl software. VI's are available to customers who want to modify the software and create new capabilities.
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Force Distance Curves measure the deflection of a cantilever as it interacts with a surface. Force-Distance measurements monitor such surface parameters as: Adhesion, Stiffness, Compliance, Hardness, and Contaminate Thickness. This advanced AFM module is flexible and enables many types of experiments.
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The environmental cell, or closed cell, is used for scanning samples in liquid or gas environments. Both the sample and probe are enclosed in a chamber that has an entry and exit port for the liquid or gas.
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This option includes a special probe holder and open liquid cell for scanning samples submerged in liquids. The Dunk and Scan can directly replace the HR AFM probe holder.
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In the STM, the current flow between a metal probe and a sample are used to control the distance between the conductive probe and conductive surface. When the probe is scanned across the surface, if the current between the probe and surface are held constant with a feedback control loop driving a piezo ceramic, the topography of the sample's surface in measured.
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Electrostatic Force Microscopy (EFM) is a type of dynamic non-contact atomic force Microscope where the electrostatic force is probed. “Dynamic” here means that the cantilever is oscillating and does not make contact with the sample. This force arises due to the attraction or repulsion of separated charges.
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